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Si wafer specification | |||||
Size |
2 inch | 4 inch | 6 inch | 8 inch | 12 inch |
Thicness | 275 μm | 525 μm | 625 μm | 725 μm | 750 μm |
Type / dopant | P-tyep / Boron (B) or N-type / Phosphorus (P), Antimony (Sb), Arsenic (As) | ||||
Orientation | <100>, <110>, <111> | ||||
Resistivity | - Low resistivity: < 0.005 ohm.cm (high dopped) - Normal resistivity: 1 ~ 100 ohm.cm - High resistivity: > 1,000 ohm.cm (undopped) | ||||
Grade | Prime, Test, Dummy | ||||
Surface finished | Single side polished or Double side polished | ||||
Process service | 1. Thermal oxidation: 30 Å ~ 3 μm 2. Nitride: 150 nm ~ 300 nm 3. E-beam evaporator and suputtering: metal depostion (thickness: customerized) 4. CMP: thickness (customerized) 5. Dicing: customerized 6. Patterning: photo and e-beam lithography |