Home > 제품소개 > Negative photo resist

Sample Description | Processing | |
| - Straight wall negative photoresist in KemLab Inc NPR photoresist series modified for 405nm wavelength exposure. - Lithography: Images look excellent under microscope: using a mask, 1 micron lines resolved withvery little LER. | - Coat: Spread Cycle: 5 sec spread cycle at 1000 rpm, Spin Cycle: Accelerate at 1000 r/s to final spin speed for 45 seconds. - Soft-Bake: 110o C for 90 seconds (hotplate) - Exposure: Broadband contact exposure 300 mJ/cm2 at 405nm wavelength using 400nm cutoff filter on silicon. Intensity @ 405 = 18.4 mW/cm2. - Dose will vary on different substrates & exposure tools. For single wavelength exposure tool, we think it will need ~ 50% more dose, but we have no way to measure. - Post Exposure Bake: 110o C for 90 seconds (hotplate) - Develop: ~ 30 - 40 seconds: immersion in 0.26N TMAH developer - Film Thickness = 2.04 micron at 2000 rpm, Viscosity = 16 cst | |
Wavelength (nm) |
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Tone | Product (link) | Film Thickness (µm) | Feature |
| Adhesion Promoter | SurPass | NA | Novolac, DNQ, PMMA, HSQ, PMGI, SU-8, SML, PI, ... |
| Negative | HARE SQ series | 2 – 100 and 200* | Epoxy. |
| SQ QuickDry series | 2 – 200 | Epoxy, Quick drying solvent. | |
| SQ MicroCoat series | 0.05 – 2 | Epoxy, Thin film, Surface protection. | |
| SQ OptiCoat series | 2 – 100 | Epoxy, Higher transparency. | |
| APOL-LO 3200 series | 2 – 10+ | Lift-off profile. | |
| KL NPR series | 1 – 20 | Vertical profile. | |
| XP 405nm NPR 2 | 2 | 405nm wavelength exposure, Vertical profile. | |
| Image Reversal | KL IR 15, KL IR Lift-Off 15 | 1.2 – 2.6 | Lift-off profile (negative), Vertical profile (negative). |
| Positive | KL 7000 series | 0.15 – 3 | High resolution, No PFAS and Fluorine. |
| KL 6000 series | 2.5 – 11 | General thick purpose. | |
| K-PRO series | 0.8 – 25 and 50* | Plating and etch application. Advanced packaging | |
| Protective Surface Coating | PSC-1003 | 2.4 – 5.3 | Protective Surface Coating |
| Conductive layer | DisCharge H2OX4 | 80 – 170 | Improved Scanning Electron Microscope Imaging on Non-Conductive Substrate |