Home > 제품소개 > Positive ebeam resist
Characterisation |
Properties | |||||||||||||||||||||||||||
- E-beam; layer thickn. 0,05 - 1,6 μm (6000 - 1000 rpm) - High sensitivity which can be adjusted via the developer - Highest resolution (< 10 nm) and very high contrast - Highly process-stable, high plasma etching resistance - Easy fabrication of lift-off structures - Safer solvent anisole |
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Spin Curve |
Process chemicals | ||||||||||||
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Process results | |||
![]() Resolution AR-P 6200 of 10 nm (thickness: 180 nm) |
![]() Undercut structures obtained with increased exposure dose | ||
![]() T-gate structures produced with a triple-layer system |
![]() AR-P 6200.09 as top resist for extreme lift-off applications (two-layer systems) | ||
![]() 19 nm metal lines after lift-off process with AR-P 6200.09 |
![]() Chromium-structures after lift-off process |
Tone | Product (link) | Film Thickness (nm) | Feature |
Adhesion Promoter | SurPass series | NA | Apply resist: Novolac, DNQ, PMMA, HSQ, PMGI, SU-8, SML, PI, ... |
Negative ebeam resist | HSQ series | 8 – 1,650 | Dilution: 1 - 45%. Supply: Powder, Solution. |
H-SiQ series | 25 – 850 | Dilution: 2 - 20%. Supply: Powder, Solution. | |
AR-N 7520 New series | 100 – 800 | Best resolution: 28 nm. e-beam, DUV, i-line. | |
Positive ebeam resist | HARP PMMA series | 50 – 3,700 | m/W: 950K, 495K. Dilution: 2 - 11 %. |
HARP-C Copolymer series | 150 – 1,100 | MMA/MAA Copolyer. Dilution: 6 - 12 %. | |
PMMA series | 40 – 7,000 | m/W: 950K, 495K, 350K, 120K, 35K. Dilution: 1 - 18 %. | |
Copolymer series | 100 – 1,100 | Copolymer. Dilution: 1 - 13 %. | |
SML series | 50 – 4,800 | High resolution: 5 nm. Aspect ratio: >50:1. Slow etch rate. | |
Conductive layer | DisCharge H2O series | 25 – 170 | Apply resist: PMMA, HSQ, mr-PosEBR, AR-P 6200, ZEP, SML. |
Protective Surface Coating | PSC-1003 | 2.4 – 5.3 | Protective Surface Coating |
PSC-IB DPM 1010 | 10 (@ 2000 RPM) | Protective Surface Coating |